Scanning electron microscope, image of an atomic force microscopy diamond tip resting on a 7 nm delayered SRAM. AFM-in-SEM can simultaneously mill and look for electrical anomalies. It’ll be a great talk.
What actually happens electrically inside advanced-node devices when you remove material one nanometer at a time?
Join my webinar on Conductive
AFM at the link below!
attendee.gotowebinar.com/register/200...
#physics #AFM #manufacturing #microscopy #STEM #microelectronics
15.01.2026 22:14
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Ever wondered how semiconductor failure analysis engineers find defects or characterize individual devices?
Join my webinar, Monday night (ET US), to learn …
“Ten signals for Device Characterization and Defect Localization”
register.gotowebinar.com/register/580...
#physics #manufacturing
07.11.2025 21:35
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Journalists say I have seen it but you shouldn’t don’t understand human nature or journalism. Say out loud (I’m addressing a person on TikTok) I chose not to see it out of respect.
12.09.2025 10:11
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Black and white photo of the binocluars being used by German Army personnel in the Second World War
Photo of the binoculars in the control tower at Heathrow
photo of the binoculars in the control tower at Heathrow
Did you know that the Heathrow control tower has a set of German Zeiss spotting binoculars from the Second World War?
02.12.2024 18:22
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